METHOD AND SYSTEM FOR DEFLECTING A FOCUSSED ELECTR

专利名称：METHOD AND SYSTEM FOR DEFLECTING A

FOCUSSED ELECTRON BEAM ALONG APREDETERMINED PROCESSING PATH

发明人：Dieter Koch申请号：US06/551871申请日：19831115公开号：US04595819A公开日：19860617

摘要：The two dimensional processing path along which the electron beam of awelder is to be deflected during a processing cycle is approximated by a sequence ofpoints separated by predetermined distances from one another. The deflection signalsfor the beam are derived from analog signals having levels corresponding to the points,and interpolation there between. The rate of interpolation depends on the distancebetween the points and time intervals specified so as to create preselected beamvelocities. Since a weld is improved when there is micromotion of the beam around theprocessing, a modulation path generator is also provided. Since the coordinates furnishedby this modulation path generator are in a fixed coordinate system and the micromotionof the beam is relative to the processing path, a coordinate rotation is carried out beforethe modulation signals are superimposed upon the processing path deflection signals.For increased accuracy, the movement of the beam is controlled by a closed loop systemin which the actual position of the gap to be welded is determined in a separate cycle,compared to the desired position and a corresponding error signal generated andstored. A correction signal corresponding to the error signal is then added onto the

modulation signals prior to coordinate rotation in the next processing cycle.

申请人：INSTITUT FUER KERNTECHNIK UND ENERGIEWANDLUNG E.V.

代理人：Erwin S. Teltscher

更多信息请下载全文后查看