专利名称：Cap inspection device发明人：松村 貴之,中川 圭太郎申请号：JP2018084568申请日：20180425公开号：JP2019191015A公开日：20191031
专利附图：
摘要：Cap inspection device 4 includesA gripper 5 (carrying means) for transportingthe cap 1 capped container 1The slit light irradiating means 8 for irradiating the slit 3a ofthe cap 3 with the slit light LThe photographing means 9 fills the slit light irradiated onthe top surface of the cap from different anglesThe control means 10 is provided with a
control means 10 for detecting an unevenness of the cap surface by inputting an imagefrom the above described photographing means.The control means 10 determines thatthe cap is defective when a local unevenness is detected on the cap surface.When a partof the cap is deformed and is locally bitten, a local protrusion is formed on the topsurface 3a of the cap 3, so that a capping failure can be detected by detecting this.Diagram
申请人：澁谷工業株式会社
地址：石川県金沢市大豆田本町甲５８番地
国籍：JP
代理人：神崎 真一郎,神崎 真
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