SYSTEMS AND METHODS FOR CALIBRATION, VERIFICATION,

专利名称：SYSTEMS AND METHODS FOR

CALIBRATION, VERIFICATION, ANDSENSITIVITY CHECKS FOR DETECTORS

发明人：SCHMIDT, Hartwig,PATTERSON, Michael,

E.,LUKOW, Stefan, R.,GONTHIER, Kenneth,R.,LAI, Hanh, T.,MISHRA, Vibha

申请号：EP17882527.9申请日：20171220公开号：EP3559606A1公开日：20191030

摘要：The present disclosure is directed to methods and systems for calibration,calibration verification, and sensitivity checks for a detector. The methods and systemsinclude calibrating a detector by releasing at least one calibrant from at least onecalibrant chamber in flow communication with the detector. The systems and methodsfurther include verifying the calibration by releasing at least one verification substancefrom at least one verification chamber in flow communication with the detector. Thesystems and methods further include checking a sensitivity of the detector by releasingat least one sensitivity substance from at least one sensitivity chamber in flowcommunication with the detector.

申请人：Rapiscan Systems, Inc.

地址：2805 Columbia Street Torrance, CA 90503 US

国籍：US

代理机构：Barker Brettell LLP

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