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Alignment device and lithographic apparatus compri

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专利名称:Alignment device and lithographic apparatus

comprising such a device

发明人:Peter Dirksen,Antonius M. Nuijs申请号:US09324421申请日:19990601公开号:US06417922B1公开日:20020709

专利附图:

摘要:An alignment device, for use in a lithographic apparatus, for aligning a firstobject, provided with a first alignment mark relative to a second object, provided with asecond alignment mark, employs as a radiation source a laser which emits an alignment

beam having a wavelength which is of the order of 1000 nm and to the order of 1100 nm.

申请人:ASML NETHERLANDS B.V.

代理机构:Pillsbury Winthrop LLP

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